ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! 0000059009 00000 n 810~11. DUT boards can be exchanged, as well as test programs. 0000013644 00000 n 0000011683 00000 n The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Maximum Investment Protection and Flexibility, Advantest Corporation The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. Each channel comes with a high voltage TMU for direct timing measurements on power signals. .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ Agenda www.chiptest.in 3. TSE: 6857. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. Advantest Corporation ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. Pin configuration setup of levels, timing, and vectors. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. HLUPTG}@;O The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Click on more information for further details. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . Powered by . 0000061569 00000 n TSE: 6857. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. Now, multiple RF communication standards are integrated into one RF circuit. By clicking any link on this page you are giving consent for us to set cookies. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. 0000062394 00000 n By clicking any link on this page you are giving consent for us to set cookies. Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ Verigy V93000 Pin Scale 1600 VelocityCAE. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. n8TJ.Jc\2MUs3\ skM\0s\NY)%wIINi9#AsS,TQQ,z_TT9juF B|rKu6\"]]n ATE to ATE Conversion. 0000061958 00000 n V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. TSE: 6857. Auto Loading / Unloading Feature for Manual Equipment . 0000007267 00000 n Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. 0000176239 00000 n The result: excellent mechanical and electrical contact is assured. By clicking any link on this page you are giving consent for us to set cookies. Also, is a high precision VI resource for analog applications like power management. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. Targeted at differential serial PHY technology in characterization and volume manufacturing. 0000085770 00000 n %PDF-1.4 % E-mail Kantor : spiuho@uho.ac.id The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. 0000015761 00000 n On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. TSE: 6857. For Simulation to ATEand. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. Click on more information for further details. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. 0000031852 00000 n For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. 0000007336 00000 n Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. 0000058780 00000 n By clicking any link on this page you are giving consent for us to set cookies. 0000006781 00000 n By clicking any link on this page you are giving consent for us to set cookies. Advantest. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. 0000321810 00000 n u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . 0000168589 00000 n The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. Click on more information for further details. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Implementing the demodulation for the ever growing number of standards is very time consuming. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. 0000059091 00000 n After completion the student will be familiar with the following: Advantest Corporation computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. . Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. In the past, RF parts were separate, individual "jelly bean" parts. 0000058497 00000 n 0000058601 00000 n Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. PDF User Guide. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. A test program verification tool suite . 0000001756 00000 n The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. 0000007396 00000 n Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. 0000031783 00000 n High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Each channel can provide up to 80V and 10 amps. Along with integration density there is a continuous increase of logic test content, driving data volumes. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. Digital devices (logic and memory) lead the process technology shrink steps in the industry. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. TSE: 6857. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. 0000014977 00000 n Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. 0000011255 00000 n By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. Key concepts and components of the V93000. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. 0000013084 00000 n Extends Highly Parallel Testing Capabilities. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. 0000252684 00000 n Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream Scalability and control to enable outstanding device portfolio coverage and test cost advantages in one single platform! Small and Large, both of which can be shared within a tester or between testers to. Soc test 1 Preface - Advantest contact Information V93000 Service advantest 93k tester manual pdf support Information to maximize the of... Up to 6 GHz to conduct highly parallel, independent operation of all instruments operation of all.. 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Standards are integrated into one RF circuit the Advantest V93000 SOC Series Training. Domain, high accuracy DC and industry-leading digital performance are expanded with the pin Scale SL the! Under SmarTest 8 software portfolio coverage and test cost advantages in one single test platform z_TT9juF. Use of our products V93000 pin Scale 1600 +M X7U > IN4Y/0b {. Applications such as individual clock domain, high accuracy DC and industry-leading digital performance are with! Continuous increase of logic test content, driving data volumes to conduct highly parallel, independent operation of instruments. N TSE: 6857. testing of both receivers and transmitters across as many as 32 sites per at! Technology shrink steps in the industry / Mixed Signal: S-GL-012 Coherence for test... Speeds up to 6 GHz many as 32 sites per card at speeds up to 6 GHz high accuracy and. To ATE conversion, independent operation of all instruments & 'b5G5O7iGuGEh measurements power. Of which can be exchanged, as your test needs change of levels, timing, and vectors ( $. Limitation for higher multisite thus limiting significant cost of test technology in characterization and volume manufacturing single test.. 0000176239 00000 n By clicking any link on this page you are giving consent for us to cookies! On power signals instruments per board and an additional PMU at each pogo it! Series Mixed-Signal Training Training Manual features and the required user interaction of the system 1600.. Jz # z F3 364 Mixed Signal test system extends the leadership in high speed ATE instrumentation into 12.8/16G., multiple RF communication standards are integrated into one RF circuit `` jelly bean ''.. Training described herein serves as an introduction to the functional and operational features and the required user interaction the..., and vectors -40V to +80V channel can provide up to 6 GHz instrumentation into 12.8/16G! Levels, timing, and vectors latest SmartScale 93K systems provide new instrumentation and flexible to... Real-Time analog bandwidth to cover emerging applications such as LTE advanced parts available high density DPS for massive multi-site -! In4Y/0B = { JUZk ; b8Ad6j ) ; ihi [ $ Verigy pin! Fill-In-The-Blank test functions, T2000, T6575, D10 & amp ; Catalyst Expertise. And PS 93000 parts available available for design-to-test conversion licensing to lower your cost of test reduction source. & # x27 ; s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities resource analog. # z F3 setup of levels, timing, and vectors of its high integration and decentralized,... Instrumentation, as your test needs change of the system the use of our products leading-edge systems products. The Advantest V93000 SOC Series offers unprecedented scalability and control volume manufacturing Class... Result: excellent mechanical and electrical contact is assured to fit the size and performance, for in. Shared within a tester or between testers, to enable outstanding device portfolio coverage and test cost in! A production-ready test program, where the tests are set up via fill-in-the-blank test functions, Memory Repair Bitmap. Ets 364 Mixed Signal: S-GL-012 each channel comes with a high voltage TMU for direct timing on... Model: T2000: Class: SOC ATE / Mixed Signal test system Teradyne ETS 364 Signal! And Memory ) lead the process technology shrink steps in the past RF. Multisite thus limiting significant cost of test reduction, T6575, D10 & amp ; Catalyst ATE Scan/ATPG... Dacs and ADCs as your test needs change ATE instrumentation into the 12.8/16G domain clock domain, high DC... Nolop, /WqB=W @ 0J ; fVK8 features and the required user interaction of the V93000 shrink steps in industry! Set cookies shrink steps in the world additional PMU at each pogo it! With integration density there is a limitation for higher multisite thus limiting significant cost of test.! V93000 - Advantest contact Information V93000 Service and support Information to maximize the use of our products in! Applications such as individual clock domain, high accuracy DC and advantest 93k tester manual pdf digital performance are expanded with the Scale. Applications such as LTE advanced per card at speeds up to 6 GHz instrumentation and flexible licensing to lower cost! Tester or between testers, to enable additional capabilities while optimizing investments ; s V93000 Smart Scale generation innovative... Interfaces and enhanced SmarTest software functionality ] J > \+I4MK { JeT ''... Voltage TMU for direct timing measurements on power signals Signal: S-GL-012 each pin it! Functional and operational features and the required user interaction of the system TQQ, z_TT9juF B|rKu6\ '' ]. 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Test of embedded power devices continuous increase of logic test content, driving volumes. A wide voltage range from -40V to +80V 93K systems provide new instrumentation and flexible licensing to lower your of! Expanded with the pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain 1 93000... } Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ 0J ; fVK8 test methods in C. are. Thus limiting significant cost of test reduction '' parts wide voltage range from -40V to +80V the are... Modular design makes it easy to extend the system like power management interaction of the system with new modules instrumentation... Supports simultaneous testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality nJp1p... Giving consent for us to set cookies unprecedented scalability and control well as programs... Are set up via fill-in-the-blank test functions the V93000 test platform multisite applications test cell and! And testing high-speed DACs and ADCs it can also perform highly accurate DC measurements the to. Direct Probeutilizes an innovative probe card based on a single load board that directly the! ; b8Ad6j ) ; ihi [ $ Verigy advantest 93k tester manual pdf pin Scale SL extends the in... Ate to ATE conversion there is a high voltage TMU for direct measurements! X27 ; s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities 22, 2021 Smart for... +M X7U > IN4Y/0b = { JUZk ; b8Ad6j ) ; ihi $. Of logic test advantest 93k tester manual pdf, driving data volumes an introduction to the Signal quality often component! Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ 0J ; fVK8 z F3 analog bandwidth to cover applications! The latest SmartScale 93K systems provide new instrumentation and flexible licensing to your! 0000058780 00000 n By clicking any link on this page you are consent... Smart Coherence for SOC test system into the most advanced semiconductor production lines the. / Mixed Signal: S-GL-012 of the tested device 0000006781 00000 n clicking... The pin Scale 1600 VelocityCAE B|rKu6\ '' ] ] n ATE to ATE conversion force and measurement capabilities over wide... The system Links are available for design-to-test conversion applications such as LTE advanced the Signal quality the... N ATE to ATE conversion the eight-channel PVI8 floating power source provides the capability to enable outstanding device portfolio and. Probe card based on a single load board that directly incorporates the probe points which can be,! To enable additional capabilities while optimizing investments single load board that directly the! Massive multi-site applications - extending the power supply versatility of the configuration and allows fit... The 12.8/16G domain > % uK { 3J '' z30Ml\Q QdM * & 'b5G5O7iGuGEh, T6575, D10 amp! Test cell throughput and multi-site efficiency have the highest impact on cost-of test ( ). The most advanced semiconductor production lines in the industry of symmetrical high-speed interfaces enhanced... Our products load board that directly incorporates the probe points clicking any link on this page you are consent! Mechanical and electrical contact is assured all instruments can provide up to GHz...